(2-2) 3 Cr. Hrs.
Currently no sections of this class being offered.
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This course introduces the fundamentals of Scanning Electron Microscopy (SEM) and quantitative Image Analysis (IA) currently used in support of effective materials, characterization and evaluations. Topics covered in the course include microscopy systems and components, applications in fractography and quantifiable measurements used in process and surface failure analysis, materials characterization and product development studies. The course is recommended for students specifically interested in specialized laboratory practices.
(A requirement that must be completed before taking this course.)
Upon successful completion of the course, the student should be able to: